Revolutionary True 3D In-line Dispensing Process Inspection (DPI) with a Thickness Measurement Solution based on Patented Technologies
Most optical systems use UV light to inspect the surface for presence and gauges to measure material thickness in a particular spot, which does not provide the accuracy and repeatability needed. Inspecting transparent materials proved to be a challenge for traditional laser-confocal or electron microscope systems that only measure three-dimensional shapes.
Koh Young’s revolutionary Neptune C+ provides the ultimate solution to these challenges.
